Thumbnail Image
Item

Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

Bar-Lev,S.K.
; 
van der Duyn Schouten,F.A.
Abstract
Description
DP 2003-83
Date
2007
Journal Title
Journal ISSN
Volume Title
Publisher
Collections
Tilburg University Research Output Collection
Show all metadata
Files
Thumbnail Image
JASS2007.pdf
Adobe PDF, 94.73 KB
Research Projects
Organizational Units
Journal Issue
Keywords
Citation
Bar-Lev, S K & van der Duyn Schouten, F A 2007, 'Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution', Journal of Applied Statistical Science, vol. 16, no. 1, pp. 115-126.
URI
https://hdl.handle.net/20.500.14602/45498
Embedded videos