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Outlier detection with one-class classifiers from ML and KDD

Janssens,J.H.M.
; 
Flesch,I.
; 
Postma,E.O.
Abstract
Experimental results show that LOF and SVDD are the two best-performing methods. It is concluded that both fields offer outlier-detection methods that are competitive in performance and that bridging the gap between both fields may facilitate the development of outlier-detection methods.
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Date
2009
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ICMLA
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Tilburg University Research Output Collection
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Janssens, J H M, Flesch, I & Postma, E O 2009, Outlier detection with one-class classifiers from ML and KDD. in A Wani, M Kantardzic, V Palade, L Kurgan & Y Qi (eds), Proceedings of the Eight International Conference on Machine Learning and Applications. ICMLA, Miami, FL, USA, pp. 147-153. < http://www.icmla-conference.org/icmla09/ >
URI
https://hdl.handle.net/20.500.14602/15592
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