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Dealing with risk in incident management: An application of high reliability theory

van den Eede,G.G.P.
van de Walle,B.A.
Rutkowski,A.F.
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2006
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IEEE Press
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van den Eede, G G P, van de Walle, B A & Rutkowski, A F 2006, Dealing with risk in incident management : An application of high reliability theory. in R Sprague (ed.), Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). IEEE Press, Washington, pp. 37C. https://doi.org/10.1109/hicss.2006.112
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